Applied logistic regression  
Hosmer, David W. 
 - 2nd ed. 
 - New York :  Wiley,  2000 
 - xii, 373 p. :  ill. ;  25 cm. 
 - Wiley series in probability and statistics. .
<br/><br/> A Wiley-Interscience publication." 
<br/><br/><label>ISBN: </label>0471356328 (cloth : alk. paper)